• Cite/Export
  Cite/Export

  Copy a citation

  APA (6th ed.)

  

  Chicago (Author-Date, 15th ed.)

  

  Harvard (18th ed.)

  

  MLA (7th ed.)

  

  Turabian (6th ed.)

  

  Export a citation

  Export to RefWorks   Export to EndNote / Reference Manager   Export to EasyBib   Cancel

  Note: Citations are based on reference standards. However, formatting rules can vary widely between applications and fields of interest or study. The specific requirements or preferences of your reviewing publisher, classroom teacher, institution or organization should be applied.
• Print
• E-mail
  E-mail

  All fields are required.

  The E-mail Address(es) field is required. Please enter recipient e-mail address(es).

  The E-mail Address(es) you entered is(are) not in a valid format. Please re-enter recipient e-mail address(es).

  You may send this item to up to five recipients.

  Enter recipient e-mail address(es): Separate up to five addresses with commas (,)

  The name field is required. Please enter your name.

  Enter your name: The subject field is required. Please enter the subject. Subject:

  The E-mail message field is required. Please enter the message.

  E-mail Message: I thought you might be interested in this item at http://mcgill.worldcat.org/oclc/23649536 Title: Electronic thin film science : for electrical engineers and materials scientists Author: K N Tu; James W Mayer; Leonard C Feldman Publisher: New York : Toronto : New York : Macmillan ; Maxwell Macmillan Canada ; Maxwell Macmillan International, ©1992. ISBN/ISSN: 0024215759 9780024215758 OCLC:23649536

  
  

  The ReCaptcha terms you entered were incorrect. Please try to match the 2 words shown in the window, or try the audio version.

  Cancel
• Share
• Permalink
  Permalink

  Copy this URL to link to this page:

More like this

Subjects

• Thin films, Multilayered.
• Electrical engineering -- Materials.
• Thin films.
• View all subjects

Similar Items

Electronic thin film science : for electrical engineers and materials scientists

Author:	K N Tu; James W Mayer; Leonard C Feldman
Publisher:	New York : Macmillan ; Toronto : Maxwell Macmillan Canada ; New York : Maxwell Macmillan International, ©1992.
Edition/Format:	Book : EnglishView all editions and formats